C. Grens

Compact Modeling of Mutual Thermal Coupling for the Optimal Design of SiGe HBT Power Amplifiers

J.M. Andrews, C.M. Grens, J. Cressler, 2009, IEEE Transactions on Electron Devices.

On Common–Base Avalanche Instabilities in SiGe HBTs

C.M. Grens, J. Cressler, A. Joseph, 2008, IEEE Transactions on Electron Devices.

The Effects of Scaling and Bias Configuration on Operating-Voltage Constraints in SiGe HBTs for Mixed-Signal Circuits

Qingqing Liang, J.D. Cressler, J.M. Andrews, 2007, IEEE Transactions on Electron Devices.