Udo Mahlstedt

Test generation for I/sub DDQ/ testing and leakage fault detection in CMOS circuits

Jürgen Alt, Udo Mahlstedt, Matthias Heinitz, 1992, Proceedings EURO-DAC '92: European Design Automation Conference.

Simulation of non-classical faults on the gate level - The fault simulator COMSIM

Jürgen Alt, Udo Mahlstedt, U. Mahlstedt, 1993, Proceedings of IEEE International Test Conference - (ITC).

CURRENT: a test generation system for I/sub DDQ/ testing

Jürgen Alt, Udo Mahlstedt, Matthias Heinitz, 1995, Proceedings 13th IEEE VLSI Test Symposium.

Simulation of non-classical faults on the gate level-fault modeling

Jürgen Alt, Udo Mahlstedt, 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.

DIATEST: a fast diagnostic test pattern generator for combinational circuits

Udo Mahlstedt, Torsten Grüning, Hartmut Koopmeiners, 1991, 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers.

CURRENT: A Test Generation System for IDDQ Testi:ngl

Udo Mahlstedt, Matthias Heinitz, Jiirgen Alt, 1995 .

Contest: a fast ATPG tool for very large combinational circuits

Wilfried Daehn, Udo Mahlstedt, Cengiz Özcan, 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.

Test generation for IDDQ testing and leakage fault detection in CMOS circuits

Jürgen Alt, Udo Mahlstedt, Matthias Heinitz, 1992, EURO-DAC.

DELTEST: Deterministic test generation for gate delay faults

Udo Mahlstedt, 1993, Proceedings of IEEE International Test Conference - (ITC).

Accelerated test pattern generation by cone-oriented circuit partitioning

Wilfried Daehn, Udo Mahlstedt, Cengiz Özcan, 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..

Deterministic test generation for non-classical faults on the gate level

Jürgen Alt, Udo Mahlstedt, Ingo Hollenbeck, 1995, Proceedings of the Fourth Asian Test Symposium.