A. Nassiopoulos

发表

Raman microprobe analysis of strained polysilicon deposited layers

S. Negm, H. Talaat, F. Adar, 1998 .

Micro-Raman characterization of stress distribution within free standing mono- and poly-crystalline silicon membranes

G. Kaltsas, E. Anastassakis, G. Kaltsas, 1998 .

ELECTROLUMINESCENT DEVICE BASED ON SILICON NANOPILLARS

Dimitrios Papadimitriou, A. G. Nassiopoulos, A. Nassiopoulos, 1996 .

Highly anisotropic silicon reactive ion etching for nanofabrication using mixtures of SF6/CHF3 gases

E. Gogolides, A. Tserepi, A. Nassiopoulos, 1997 .

Slow-electron-energy-loss spectroscopy in the reflection mode, compared with electron-energy-loss spectroscopy of fast electrons

A. Nassiopoulos, J. Cazaux, 1986 .

Characterization of the titanium silicon two/Si interface in titanium disilicide films on silicon, formed by deposition of alternate titanium‐silicon layers and annealing

A. Travlos, A. Nassiopoulos, P. Revva, 1994 .

Visible luminescence from one‐ and two‐dimensional silicon structures produced by conventional lithographic and reactive ion etching techniques

E. Gogolides, A. Nassiopoulos, S. Grigoropoulos, 1995 .

Continuous X-ray induced Auger microprobe analysis and microscopy: First results

A. Nassiopoulos, J. Cazaux, D. Gramari, 1983 .

Titanium disilicide on silicon by interdiffusion of titanium and amorphous silicon multilayers: transmission electron microscopy, spectroscopic ellipsometry and resistivity measurements

S. Logothetidis, C. Krontiras, S. Georga, 1994 .

Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction

G. Kaltsas, J. Landuyt, A. Travlos, 1997 .

Titanium disilicide formation by interdiffusion of titanium/amorphous silicon multilayers: Influence of the bilayer silicon to titanium thickness ratio on the film properties

A. Traverse, A. Travlos, A. Nassiopoulos, 1992 .

Anomalous effects on the current‐voltage characteristics of p‐channel metal‐oxide‐semiconductor transistors in the temperature range 4.2–50 K

D. Tsamakis, E. Rocofyllou, A. G. Nassiopoulos, 1990 .

Application of the Boltzmann Transport Equation in the Thickness Determination of Thin Films

G. Kaltsas, N. Glezos, A. Nassiopoulos, 1996 .

Electron Probe X-Ray Microanalysis of Coatings

A. Nassiopoulos, E. Valamontes, 1996 .

Monte-Carlo simulations of the point-to-point resolution in scanning Auger microscopy and X-ray microanalysis of thin overlayers

N. Glezos, A. Nassiopoulos, E. Valamontes, 1992 .

Electronic core level microanalyses and microcopies in multipurpose apparatus.

O. Jbara, A. Nassiopoulos, J. Cazaux, 1989, Journal of electron microscopy technique.

Slow-electron-energy-loss spectra and non-dipole transitions in nickel

A. Nassiopoulos, J. Cazaux, 1985 .

Lateral resolution of Auger electron spectroscopy in the energy range 5–100 keV: Thin overlayers on a high-Z material substrate

N. Glezos, A. Nassiopoulos, 1991 .

Monte carlo calculations of the X‐ray induced enhancement signal in electron probe microanalysis (EPMA) and Auger electron spectroscopy (AES) of stratified materials

A. Nassiopoulos, E. Valamontes, 1990 .

Characterization of a positive-tone wet silylation process with the AZ 5214 photoresist

Evangelos Gogolides, Michael Hatzakis, M. Hatzakis, 1994 .

Sub-micrometre luminescent porous silicon structures using lithographically patterned substrates

I. Berbezier, E. Gogolides, L. Canham, 1995 .

Characterization of light emitting silicon nanopillars produced by lithography and etching

S. Ladas, A. Travlos, S. Kennou, 1996 .

Slow electron-energy-loss spectroscopy for surface microanalysis

A. Nassiopoulos, J. Cazaux, 1985 .

High crystalline quality erbium silicide films on (100) silicon grown in high vacuum

G. Kaltsas, J. Landuyt, A. Travlos, 1996 .

Anomalous behaviour of n-channel MOS transistor characteristics in the temperature range 4.2–14 K

F. Balestra, D. Tsamakis, E. Rocofyllou, 1989 .

Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings

A. Nassiopoulos, E. Valamontes, 1996 .