P. J. Burkhardt

发表

Stabilization of SiO2 Passivation Layers with P2O5

William A. Pliskin, Joseph S. Logan, Donald R. Kerr, 1964, IBM J. Res. Dev..

Orientation dependence of built-in surface charge on thermally oxidized Silicon

L. V. Gregor, P. Balk, P. Balk, 1965 .

Space-charge-limited current flow in gallium nitride thin films

J. Veselý, M. Shatzkes, P. J. Burkhardt, 1974 .

Tracer Evaluation of Hydrogen in Steam‐Grown SiO2 Films

P. J. Burkhardt, 1967 .

Reflection Gratings as Elements in Far Infrared Masers

L. V. Gregor, P. J. Burkhardt, 1965 .

Dielectric relaxation in thermally grown SiO 2 films

P. J. Burkhardt, 1966 .

Thermal Expansion of Sputtered Silicon Nitride Films

P. J. Burkhardt, R. F. Marvel, 1969 .

Distribution of dopant in SiO2‐Si

M. Shatzkes, P. J. Burkhardt, I. Cadoff, 1976 .