Martin Hempel

发表

Defect temperature kinetics during catastrophic optical damage in high power diode lasers

Martin Hempel, Jens W. Tomm, J. Tomm, 2014, Photonics West - Optoelectronic Materials and Devices.

Emission properties of diode laser bars during pulsed high-power operation

Thomas Elsaesser, Martin Hempel, Jens W. Tomm, 2012, Photonics West - Lasers and Applications in Science and Engineering.

Analysis of 980nm emitting single-spatial mode diode lasers at high power levels by complementary imaging techniques

Thomas Elsaesser, Erik Zucker, Martin Hempel, 2015, Photonics West - Lasers and Applications in Science and Engineering.

Short-wavelength infrared defect emission as probe for degradation effects in diode lasers

Thomas Elsaesser, M. Bettiati, Martin Hempel, 2015, Photonics West - Optoelectronic Materials and Devices.

Rapid stress-testing vs. long-term aging: a case study of 980-nm emitting single-spatial mode lasers

Thomas Elsaesser, Erik Zucker, Martin Hempel, 2016, SPIE LASE.

Near-field characteristics of broad area diode lasers during catastrophic optical damage failure

Thomas Elsaesser, H. Konstanzer, Jayanta Mukherjee, 2012, Photonics Europe.

The impact of external optical feedback on the degradation behavior of high-power diode lasers

Paul Michael Petersen, Martin Hempel, Jens W. Tomm, 2013, Photonics West - Lasers and Applications in Science and Engineering.

Analysis of bulk and facet failures in AlGaAs-based high-power diode lasers

Thomas Elsaesser, Martin Hempel, Jens W. Tomm, 2013, Photonics West - Optoelectronic Materials and Devices.

High-power diode lasers under external optical feedback

Andreas Unger, Heiko Kissel, Jens Biesenbach, 2015, Photonics West - Lasers and Applications in Science and Engineering.

Internal degradation of 980nm emitting single-spatial-mode lasers during ultrahigh power operation

Thomas Elsaesser, Martin Hempel, Jens W. Tomm, 2014, Photonics West - Lasers and Applications in Science and Engineering.

Comparison of catastrophic optical damage in InP/(Al)GaInP quantum dot and quantum well diode lasers

Peter Michael Smowton, Martin Hempel, Jens W. Tomm, 2013, Photonics West - Optoelectronic Materials and Devices.

Short‐wavelength infrared defect emission as a probe of degradation processes in 980 nm single‐mode diode lasers

Thomas Elsaesser, M. Bettiati, Martin Hempel, 2014 .

Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers

Thomas Elsaesser, Nicolas Michel, Michel Krakowski, 2010 .

Kinetics of Defect Propagation during the Catastrophic Optical Damage (COD) in Broad-Area Diode Lasers

Thomas Elsaesser, Martin Hempel, Jens W. Tomm, 2012 .

Catastrophic optical damage at front and rear facets of diode lasers

Thomas Elsaesser, Nicolas Michel, Michel Krakowski, 2010 .

Mechanisms and fast kinetics of the catastrophic optical damage (COD) in GaAs‐based diode lasers

Thomas Elsaesser, Mathias Ziegler, Martin Hempel, 2011 .

Defect evolution during catastrophic optical damage of diode lasers

Thomas Elsaesser, Martin Hempel, Jens W. Tomm, 2011 .

Near-field dynamics of broad area diode laser at very high pump levels

Thomas Elsaesser, H. Konstanzer, Jayanta Mukherjee, 2011 .

High single-spatial-mode pulsed power from 980 nm emitting diode lasers

Thomas Elsaesser, M. Bettiati, Martin Hempel, 2012 .

Physical limits of semiconductor laser operation: A time-resolved analysis of catastrophic optical damage

Thomas Elsaesser, Peter E. Andersen, Mathias Ziegler, 2010 .

Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices

Massimo Vanzi, Giovanna Mura, Bruno Acklin, 2018, Journal of Electronic Materials.

Kinetics of catastrophic optical damage in GaN-based diode lasers

Thomas Elsaesser, Harald König, Bernhard Stojetz, 2015 .

Analysis of GaN based high‐power diode lasers after singular degradation events

Massimo Vanzi, Giovanna Mura, Martin Hempel, 2017 .

Long-Term Aging and Quick Stress Testing of 980-nm Single-Spatial Mode Lasers

Thomas Elsaesser, Erik Zucker, Martin Hempel, 2015, Journal of Lightwave Technology.

Shortwave infrared (SWIR) emission from 450 nm InGaN diode lasers

Thomas Elsaesser, Harald König, Bernhard Stojetz, 2016 .