Jeff Gambino

Thermal Oxidation of Cu Interconnects Capped with CoWP

F. Chen, S. Mongeon, P. DeHaven, 2005 .

A Self-Aligned Sacrificial Emitter Process for High Performance SiGe HBT in BiCMOS

Peng Cheng, Vibhor Jain, Bob Leidy, 2013 .

Process Challenges for Integration of Copper Interconnects with Low-k Dielectrics

Jeff Gambino, 2011 .

Stress Characterization of Tungsten-Filled Through Silicon via Arrays Using Very High Resolution Multi-Wavelength Raman Spectroscopy

Bucknell C. Webb, Woo Sik Yoo, Takeshi Ueda, 2011 .