C.B. Sia

A novel RFCMOS process monitoring test structure

C.B. Sia, B.H. Ong, K.M. Lim, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

An accurate and scalable differential inductor design kit [RFIC applications]

C.B. Sia, K.S. Yeo, M.A. Do, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).