M. Rohner

From wafer-level gate-oxide reliability towards ESD failures in advanced CMOS technologies

M. Kerber, A. Kerber, A. Kerber, 2006, IEEE Transactions on Electron Devices.

Lifetime Prediction for CMOS Devices with Ultra Thin Gate Oxides Based on Progressive Breakdown

M. Kerber, A. Kerber, T. Pompl, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.