Nicholas F. Schade

Finite-element analysis (FEA) as an EMC prediction tool

David S. Dixon, Michael D. Obara, Nicholas F. Schade, 1993 .

Using the MIL-C-38999 test fixture and an S-parameter test set to measure the transfer impedance of a new universal ground adapter

David S. Dixon, Michael D. Obara, Nicholas F. Schade, 1990, IEEE International Symposium on Electromagnetic Compatibility.