M Weyland

Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric.

S D Findlay, L J Allen, M. Weyland, 2017, Ultramicroscopy.

Low magnification differential phase contrast imaging of electric fields in crystals with fine electron probes.

S D Findlay, M. Weyland, N. Shibata, 2016, Ultramicroscopy.

Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy.

S D Findlay, L J Allen, A. J. D’Alfonso, 2015, Ultramicroscopy.

Magnetite morphology and life on Mars

P A Midgley, R. Frankel, P. Midgley, 2001, Proceedings of the National Academy of Sciences of the United States of America.