C.D. Young
发表
Q. Wang,
G. Bersuker,
B.H. Lee,
2005,
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
J.C. Lee,
Byoung Hun Lee,
G. Bersuker,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
G. Bersuker,
G.A. Brown,
G. Bersuker,
2007,
IEEE Transactions on Electron Devices.
M. Gardner,
B.H. Lee,
M.S. Rahman,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
G. Bersuker,
P. Zeitzoff,
B.H. Lee,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
G. Bersuker,
D. Heh,
C.D. Young,
2008,
IEEE Electron Device Letters.
S. Datta,
R. Jammy,
P. Majhi,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
G. Bersuker,
M. Gardner,
P. Zeitzoff,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
G.A. Brown,
C.D. Young,
P.M. Zeitzoff,
2003,
IEEE Electron Device Letters.
Byoung Hun Lee,
G. Bersuker,
Rino Choi,
2006,
IEEE Transactions on Device and Materials Reliability.
Hongfa Luan,
Kisik Choi,
Byoung Hun Lee,
2006,
IEEE Electron Device Letters.
J.C. Lee,
G. Bersuker,
B.H. Lee,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
G. Bersuker,
R. Jammy,
B.H. Lee,
2008,
2008 IEEE International Electron Devices Meeting.
Chang Yong Kang,
Byoung Hun Lee,
Sung Woo Kim,
2008,
2008 IEEE International Reliability Physics Symposium.