S. Chou

Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs

Sheng-Yi Huang, Kun-Ming Chen, G. Huang, 2011, IEEE Transactions on Electron Devices.

Temperature dependence of substrate currents of MOSFETs under different drain and gate biases

Chuan-Hsi Liu, S. Chou, Heng-Sheng Huang, 2011 .

Improving breakdown voltage of SiC/Si heterojunction with graded structure by rapid thermal CVD technology

Y. Fang, K. Wu, J. Hwang, 1997 .

Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for n-Channel Metal–Oxide–Semiconductor Field-Effect-Transistor of 0.13 µm Technology

Hung-Wen Chen, S. Chou, Shuang-Yuan Chen, 2006 .

Transistor variability after CHC and NBTI stress in 90 nm pMOSFET technology

Shuang-Yuan Chen, Heng-Sheng Huang, Sam Chou, 2009 .

Mismatches after Hot-Carrier Injection in Advanced Complementary Metal–Oxide–Semiconductor Technology Particularly for Analog Applications

Sam Chou, Joe Ko, Hung-Wen Chen, 2006 .