Canan Karaaliog̃lu

Broadband THz Attenuation by Optically Excited Charge Carriers in Silicon

R. Martini, M. Brucherseifer, Canan Karaaliog̃lu, 2005 .

Fourier transform method for measurement of thin film thickness by speckle interferometry

Canan Karaaliog̃lu, Y. Skarlatos, 2003 .

Measurement of thin film thickness by electronic speckle pattern interferometry

Y. Skarlatos, Canan Karaaliog̃lu, Canan Karaaliog̃lu, 2004 .