E. Hostetter
发表
Avalanche current induced hot carrier degradation in 200 GHz SiGe heterojunction bipolar transistors
Gregory G. Freeman,
Fernando Guarin,
Zhijian Yang,
2003,
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
G. Freeman,
A. Vayshenker,
D.C. Ahlgren,
1998,
28th European Solid-State Device Research Conference.
Jae-Sung Rieh,
G. Freeman,
D. Ahlgren,
2003,
25th Annual Technical Digest 2003. IEEE Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003..
Jae-Sung Rieh,
David C. Ahlgren,
Greg Freeman,
2003
.