D.M. Tanner

Effect of W coating on microengine performance

W. M. Miller, D. Laván, M. Dugger, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

Accelerating aging failures in MEMS devices

T. B. Parson, M. Jenkins, A. Corwin, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Human Body Model, Machine Model, and Charge Device Model ESD testing of surface micromachined microelectromechanical systems (MEMS)

J. Soden, E. I. Cole, E.I. Cole, 2001, 2001 Electrical Overstress/Electrostatic Discharge Symposium.

Failure modes in surface micromachined microelectromechanical actuators

P. Clews, J.J. Sniegowski, D.M. Tanner, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).