Heng−Sheng Haung

发表

Mismatches after Hot-Carrier Injection in Advanced Complementary Metal–Oxide–Semiconductor Technology Particularly for Analog Applications

Sam Chou, Joe Ko, Hung-Wen Chen, 2006 .

Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors of 0.13 µm Technology

Sam Chou, Joe Ko, Shuang-Yuan Chen, 2006 .