P R Blaustein

Characterisation of deformations and texture defects on polished wafers of III-V compound crystals by the magic mirror method

K. Lie, C C Shiue, K H Lie, 1992 .

Characterisation of mirror-polished Si wafers and advanced Si substrate structures using the magic mirror method

P R Blaustein, K Kugimiya, S Hahn, 1992 .