Q. Kan
发表
R. Lai,
M. Barsky,
P. Chin,
2007,
2007 IEEE 19th International Conference on Indium Phosphide & Related Materials.
R. Lai,
P. Chin,
A. Oki,
2006,
2006 International Conference on Indium Phosphide and Related Materials Conference Proceedings.
R. Grundbacher,
R. Lai,
P.H. Liu,
2005,
International Conference on Indium Phosphide and Related Materials, 2005.
M. Barsky,
R. Grundbacher,
R. Lai,
2003,
IEEE Electron Device Letters.
Reliability Evaluation of 0.1 μm AlSb/InAs HEMT Low Noise Amplifiers for Ultralow-Power Applications
J.M. Yang,
J. B. Boos,
Y.C. Chou,
2007,
2007 ROCS Workshop[Reliability of Compound Semiconductors Digest].
R. Lai,
R. Grundbacher,
P. Liu,
2003,
25th Annual Technical Digest 2003. IEEE Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003..
R. Lai,
A. Oki,
Y. Chou,
2003,
International Conference onIndium Phosphide and Related Materials, 2003..
M. Barsky,
R. Grundbacher,
R. Lai,
2002,
24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu.
R. Lai,
T.R. Block,
Q. Kan,
2005,
IEEE Transactions on Microwave Theory and Techniques.
Richard Lai,
David Leung,
Barry R. Allen,
2005,
IEEE MTT-S International Microwave Symposium Digest, 2005..
R. Grundbacher,
R. Lai,
D. Okazaki,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
R. Grundbacher,
A. Oki,
D. Leung,
2006,
Microelectron. Reliab..