M.-F. Li
发表
D.S.H. Chan,
N. Balasubramanian,
D. Kwong,
2005,
IEEE Electron Device Letters.
Albert Chin,
W.J. Chen,
C.H. Huang,
2003,
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
E. Augendre,
S. Biesemans,
M. Jurczak,
2007,
IEEE Electron Device Letters.
D.S.H. Chan,
N. Balasubramanian,
A.D. Trigg,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
Byung Jin Cho,
A. Chin,
M.B. Yu,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
A. Chin,
D. Kwong,
A. Chin,
2004,
IEEE Electron Device Letters.
Yee-Chia Yeo,
X.P. Wang,
D.-L. Kwong,
2006,
IEEE Electron Device Letters.
D.S.H. Chan,
J.F. Kang,
J.D. Chen,
2003,
IEEE International Electron Devices Meeting 2003.
H.J. Tao,
S.C. Chen,
W.J. Chen,
2006,
2006 International Electron Devices Meeting.
J.F. Kang,
J.M. Lai,
A. Chin,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
Jinfeng Kang,
Dim-Lee Kwong,
X. Y. Liu,
2005
.
D.S.H. Chan,
J.F. Kang,
R.Q. Han,
2005,
IEEE Electron Device Letters.
D.S.H. Chan,
X.P. Wang,
D.L. Kwong,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
D.S.H. Chan,
J.F. Kang,
D. Kwong,
2004,
IEEE Electron Device Letters.