Mustapha Slamani

发表

Impedance mismatch and lumped capacitance effects in high frequency testing

I. T. Sylla, Mustapha Slamani, Bozena Kaminska, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

An efficient RF power transfer and bidirectional data transmission to implantable electronic devices

Mohamad Sawan, Mustapha Slamani, Abdelouahab Djemouai, 1999, ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349).

JOINT DESIGN AND TEST CONSIDERATION IN HIGH FREQUENCY CIRCUITS

Fadhel M. Ghannouchi, Bozena Kaminska, Mustapha Slamani, 1997 .

Correlating inline data with final test outcomes in analog/RF devices

Yiorgos Makris, Mustapha Slamani, Nathan Kupp, 2011, 2011 Design, Automation & Test in Europe.

Analog circuit fault diagnosis based on sensitivity computation and functional testing

Bozena Kaminska, Mustapha Slamani, B. Kaminska, 1992, IEEE Design & Test of Computers.

Multifrequency testability analysis for analog circuits

Bozena Kaminska, Mustapha Slamani, B. Kaminska, 1994, Proceedings of IEEE VLSI Test Symposium.

New frequency-locked loop based on CMOS frequency-to-voltage converter: design and implementation

Mohamad Sawan, Mustapha Slamani, A. Djemouai, 2001 .

A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface

Bozena Kaminska, Mustapha Slamani, Iboun Taimiya Sylla, 2001, J. Electron. Test..

Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude

Mustapha Slamani, William R. Eisenstadt, John Ferrario, 2010, 2010 IEEE International Test Conference.

Design for Stability of High-Speed Integrated Photoreceivers: A Tutorial

Mohamad Sawan, Mustapha Slamani, André Boyoguéno, 2005 .

Analog/RF test ordering in the early stages of production testing

Salvador Mir, Mustapha Slamani, Emmanuel Simeu, 2012, 2012 IEEE 30th VLSI Test Symposium (VTS).

Wireless Communication Products means a System-On-Chip with RF Headaches for Testing. Where is the Miracle Pill?

Mustapha Slamani, 2000 .

Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail?

Mustapha Slamani, 2005, IEEE International Conference on Test, 2005..

Wireless Test

Robert C. Aitken, Mustapha Slamani, William R. Eisenstadt, 2002, VTS.

Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction

Yiorgos Makris, Mustapha Slamani, Petros Drineas, 2008, 2008 13th European Test Symposium.

Continuous wave radar circuitry testing using OFDM technique

Mustapha Slamani, Tian Xia, Mohamed Metwally, 2014, 2014 IEEE 32nd VLSI Test Symposium (VTS).

Non-RF to RF Test Correlation Using Learning Machines: A Case Study

Yiorgos Makris, Mustapha Slamani, Haralampos-G. D. Stratigopoulos, 2007, 25th IEEE VLSI Test Symposium (VTS'07).

Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion

Mustapha Slamani, Sule Ozev, Afsaneh Nassery, 2013, 2013 18th IEEE European Test Symposium (ETS).

RF Test 101: Defining the Problem, Finding Solutions

Mustapha Slamani, 2003, ITC.

RF Testing on a Mixed Signal Tester

Jing Li, Mustapha Slamani, John Ferrario, 2007, J. Electron. Test..

10 RF Testing

Mustapha Slamani, John Ferrario, Randy L. Wolf, 2006 .

A BICMOS 120 MW 11 GHZ transimpedance amplifier Dedicated for High-Speed Photoreceivers

Mohamad Sawan, Mustapha Slamani, André Boyoguéno, 2006, J. Circuits Syst. Comput..

A low-cost test solution for wireless phone RFICs

Mustapha Slamani, John Ferrario, Randy Wolf, 2003, IEEE Commun. Mag..

OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization

Mustapha Slamani, Tian Xia, Timothy Platt, 2016, IEEE Transactions on Circuits and Systems II: Express Briefs.

A 200 MHz frequency-locked loop based on new frequency-to-voltage converters approach

Mohamad Sawan, Mustapha Slamani, Abdelouahab Djemouai, 1999, ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349).

Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector

Marian Verhelst, Mustapha Slamani, Sule Ozev, 2012, 2012 IEEE 30th VLSI Test Symposium (VTS).

Extraction of EVM from Transmitter System Parameters

Mustapha Slamani, Sule Ozev, Marian Verhelst, 2011, 2011 Sixteenth IEEE European Test Symposium.

Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector

Marian Verhelst, Mustapha Slamani, Sule Ozev, 2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

International TestConference 2008 Technical Program Committee

Abhijit Chatterjee, Kenneth M. Butler, Cecilia Metra, 2008 .

Testing highly integrated wireless circuits and systems with low cost tester: how to overcome the challenge?

Mustapha Slamani, 2002, Proceedings. International Test Conference.

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode

Vishwanath Natarajan, Shreyas Sen, Mustapha Slamani, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

RF Specification Test Compaction Using Learning Machines

Yiorgos Makris, Mustapha Slamani, Haralampos-G. D. Stratigopoulos, 2010, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique

Mustapha Slamani, Tian Xia, Timothy Platt, 2013, J. Electron. Test..

On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction

Yiorgos Makris, Mustapha Slamani, Petros Drineas, 2009, J. Electron. Test..

Improving Design and Fault Detection in Linear and Nonlinear High Frequency Circuits by Performing a Sensitivity Based Analysis

Mustapha Slamani, Iboun Taimiya Sylla, 2001 .

High performance integrated CMOS frequency-to-voltage converter

Mohamad Sawan, Mustapha Slamani, A. Djemouai, 1998, Proceedings of the Tenth International Conference on Microelectronics (Cat. No.98EX186).

Multifrequency Analysis of Faults in Analog Circuits

Bozena Kaminska, Mustapha Slamani, B. Kaminska, 1995, IEEE Des. Test Comput..

A preamplifier IC design for photonic links

Bozena Kaminska, Mustapha Slamani, André Boyogueno, 2000, 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353).

Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques

Karim Arabi, Mustapha Slamani, 2001, J. Electron. Test..