B. Kruseman

Technology scaling of critical charges in storage circuits based on cross-coupled inverter-pairs

T. Heijmen, B. Kruseman, R. van Veen, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

Comparison of defect detection capabilities of current-based and voltage-based test methods

B. Kruseman, 2000, Proceedings IEEE European Test Workshop.

Impact of gate tunnelling leakage on CMOS circuits with full open defects

C. Hora, Joan Figueras, B. Kruseman, 2007 .

Systematic defects in deep sub-micron technologies

C. Hora, Ananta K. Majhi, B. Kruseman, 2004 .

Trends in testing integrated circuits

Erik Jan Marinissen, C. Hora, Bart Vermeulen, 2004 .

ASchematic-BasedExtractionMethodologyforDislocationDefectsin Analog/Mixed-SignalDevices

Said Hamdioui, Hamidreza Hashempour, B. Kruseman, 2011 .

On hazard-free patterns for fine-delay fault testing

Ananta K. Majhi, G. Gronthoud, B. Kruseman, 2004 .

IDDQ-based diagnosis at very low voltage (VLV) for bridging defects

C. Hora, Joan Figueras, M. Lousberg, 2007 .

Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options

B. Kruseman, Tino Heijmen, 2005 .