B. Vrignon

发表

Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

Junwu Tao, E. Sicard, C. Labussiere-Dorgan, 2008, IEEE Transactions on Electromagnetic Compatibility.

Characterizing integrated circuit susceptibility with on-chip sensors

A. Boyer, B. Vrignon, S. B. Dhia, 2012, 2012 Asia-Pacific Symposium on Electromagnetic Compatibility.

Construction and evaluation of the susceptibility model of an integrated phase-locked loop

A. Boyer, S. Ben Dhia, B. Vrignon, 2011, 2011 8th Workshop on Electromagnetic Compatibility of Integrated Circuits.

Near-field injection at die level

A. Boyer, B. Vrignon, J. Shepherd, 2015, 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC).

Analysis of emission spectra evolution after accelerated aging of integrated circuits

A. Boyer, S. Ben Dhia, B. Vrignon, 2008, 2008 7th International Caribbean Conference on Devices, Circuits and Systems.

Near-field injection on a Safe System Basis Chip at silicon level

K. Abouda, B. Vrignon, A. Doridant, 2015, 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Susceptibility analysis of an operational amplifier using on-chip measurement

A. Boyer, S. Ben Dhia, B. Vrignon, 2014, 2014 International Symposium on Electromagnetic Compatibility.

A pad ICIM model for EMC immunity simulation

Wei Mao, B. Vrignon, J. Shepherd, 2012, 2012 Asia-Pacific Symposium on Electromagnetic Compatibility.

On-chip sampling and EMC modeling of I/Os switching to evaluate conducted RF disturbances propagation

S. Ben Dhia, B. Vrignon, J. Shepherd, 2010, 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility.

IC immunity modeling process validation using on-chip measurements

Alexandre Boyer, B. Vrignon, S. Ben Dhia, 2011 .

Evaluation of the near-field injection method at integrated circuit level

A. Boyer, B. Vrignon, J. Shepherd, 2014, 2014 International Symposium on Electromagnetic Compatibility.

Prediction of long-term immunity of a phase-locked loop

Alexandre Boyer, B. Vrignon, B. Li, 2011 .

Automatic verification of EMC immunity by simulation

Jianfei Wu, B. Vrignon, J. Shepherd, 2013, 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Fast conducted EMI prediction models for smart High-Side Switches

B. Vrignon, W. Teulings, 2011, 2011 8th Workshop on Electromagnetic Compatibility of Integrated Circuits.

Near-field scan - State of the art and standardisation

C. Marot, B. Vrignon, J. Shepherd, 2012, 2012 Asia-Pacific Symposium on Electromagnetic Compatibility.

An innovative methodology for evaluating multi-chip EMC in advanced 3G mobile platforms

E. Sicard, B. Vrignon, S. Baffreau, 2009, 2009 IEEE International Symposium on Electromagnetic Compatibility.

Electromagnetic Near-Field Scanning for Microelectronic Test Chip Investigation

Etienne Sicard, Peter Kralicek, Uwe Keller, 2006 .

An on-chip sensor for time domain characterization of electromagnetic interferences

A. Boyer, S. Ben Dhia, B. Vrignon, 2011, 2011 8th Workshop on Electromagnetic Compatibility of Integrated Circuits.

On a standard approach for substrate noise modelling in mixed signal IC's

O. Valorge, C. Gontrand, B. Vrignon, 2004, Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004..

Characterization of the Evolution of IC Emissions After Accelerated Aging

A. Boyer, S. Ben Dhia, B. Vrignon, 2009, IEEE Transactions on Electromagnetic Compatibility.

Characterization and modeling of parasitic emission in deep submicron CMOS

E. Sicard, B. Vrignon, S.D. Bendhia, 2005, IEEE Transactions on Electromagnetic Compatibility.

EMC of DSI3 communication protocol — PCB Consideration for Sensor product

K. Abouda, P. Besse, B. Vrignon, 2017, 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE.

On-chip sampling sensors for high frequency signals measurement: evolution and improvements

B. Vrignon, S.B. Dhia, 2004, Proceedings of the Fifth IEEE International Caracas Conference on Devices, Circuits and Systems, 2004..

IC emission spectrum drifts after burn-in cycles

A. Boyer, S. Ben Dhia, B. Vrignon, 2008, 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility.