H. Arakawa

Analysis of the Correlation Between the Programmed Threshold-Voltage Distribution Spread of nand Flash Memory Devices and Floating-Gate Impurity Concentration

R. Shirota, R. Shirota, H. Arakawa, 2011, IEEE Transactions on Electron Devices.

Low-voltage alterable EAROM cells with nitride-barrier avalanche-injection MIS (NAMIS)

M. Shinoda, S. Hijiya, S. Hijiya, 1979, IEEE Transactions on Electron Devices.