M. H. White

Characterization of thin-oxide MNOS memory transistors

J. R. Cricchi, M. White, J. Cricchi, 1972 .

Statistics of deep‐level amphoteric traps in insulators and at interfaces

M. H. White, C. C. Chao, 1985 .

0.25V FDSOI CMOS technology for ultra-low voltage applications

Huiling Shang, D. A. Adams, M. White, 2002, 2002 IEEE International SOI Conference.

Characterization of microwave transistors

M. White, M. H. White, M. O. Thurston, 1970 .