T. M. Smeeton

Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope

Colin J. Humphreys, Menno J. Kappers, C. Humphreys, 2003 .

Performance and degradation characteristics of blue–violet laser diodes grown by molecular beam epitaxy

Stewart Edward Hooper, Jonathan Heffernan, Colin J. Humphreys, 2009 .

Degradation of III‐nitride laser diodes grown by molecular beam epitaxy

Stewart Edward Hooper, Jonathan Heffernan, Colin J. Humphreys, 2008 .

Degradation of InGaN∕GaN laser diodes analyzed by microphotoluminescence and microelectroluminescence mappings

Stewart Edward Hooper, Jonathan Heffernan, Colin J. Humphreys, 2008 .

The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

Colin J. Humphreys, Menno J. Kappers, C. Humphreys, 2006 .

Design of a creep resistant nickel base superalloy for power plant applications: Part 3 - Experimental results

R. W. Evans, Franck Tancret, Thomas Sourmail, 2003 .