Jongmin Kim

发表

Depth Profiling Analysis of Aluminum Oxidation During Film Deposition in a Conventional High Vacuum System

M. Zukic, J. Weimer, D. Torr, 1994 .

Radiation damage effects in far-ultraviolet filters, thin films, and substrates.

M. Zukic, M. Torr, D. Torr, 1994, Applied optics.

Advances in Multilayer and Grazing Incidence X-Ra y/EUV/FUV Optics

J. Park, M. Zukic, Jongmin Kim, 2022 .

X-ray photoelectron spectroscopy depth profiling of oxidized aluminum thin films

Muamer Zukic, Jongmin Kim, Douglas G. Torr, 1994, Optics & Photonics.

Multilayer thin film design for far ultraviolet polarizers using an induced transmission and absorption technique

M. Zukic, D. Torr, Jongmin Kim, 1993 .

Polarimetry of H-Lyman α for coronal magnetic field diagnostics

Muamer Zukic, Jongmin Kim, Silvano Fineschi, 1993, Optics & Photonics.

Design and fabrication of the all-reflecting H-Lyman α coronagraph/polarimeter

Muamer Zukic, Jongmin Kim, Silvano Fineschi, 1993, Optics & Photonics.

Multilayer thin-film design as far-ultraviolet polarizers

Muamer Zukic, Jongmin Kim, Douglas G. Torr, 1993, Optics & Photonics.

Reflective filters design for self-filtering narrowband ultraviolet imaging experiment wide-field surveys (NUVIEWS) project

Muamer Zukic, Jongmin Kim, Jong Ho Park, 1994, Optics & Photonics.