W. Chim

Effect of transmission line pulsing of interconnects investigated using combined low-frequency noise and resistance measurements

A. See, K. Pey, L. W. Chu, 2001, Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).

Effects of electric field in band alignment measurements using photoelectron spectroscopy

S. Y. Chiam, L. Wong, J. S. Pan, 2012 .

Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectric

B. H. Koh, W. Chim, T. H. Ng, 2002, ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575).

Series resistance and effective channel mobility degradation in LDD nMOSFETs under hot-carrier stressing

D. Chan, C. Lou, W. Chim, 1999, Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394).

Hot-carrier reliability of n- and p- channel MOSFETS with polysilicon and CVD tungsten-polycide gate

D. Chan, Y. Pan, C. Lou, 1996, Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis.

A comparative study on the channel hot-carrier degradation of N- and P-MOSFETs with CVD tungsten polycide gate

D. Chan, W. Chim, Y. Pan, 1995, Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanisms

B. H. Koh, C. Tung, A. Du, 2002, ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575).

Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs

D. Chan, C. Lou, W. Chim, 1997, Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs

Y. Pan, C. Lou, D.S.H. Chan, 1995, Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits.