K. Morrisseau

High-current characterization of dual-damascene copper interconnects in SiO/sub 2/- and low-k interlevel dielectrics for advanced CMOS semiconductor technologies

M. Hargrove, S. Voldman, R. Gauthier, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

High-current transmission line pulse characterization of aluminum and copper interconnects for advanced CMOS semiconductor technologies

Steven H. Voldman, Robert J. Gauthier, S. Voldman, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).

No News Isn’t Always Good News: Media Representation of Missing and Murdered Indigenous Women in Canada

D. Taylor, R. Fox, A. Williams, 2019 .