N. Garbar

发表

Noise and Generation/Recombination Noise

P. Ashburn, I. Mitrovic, S. Hall, 2005 .

1/f noise and generation/recombination noise in SiGe HBTs on SOI

P. Ashburn, O. Buiu, N. Lukyanchikova, 2005, IEEE Transactions on Electron Devices.

Physical Insights on Charge Transport Mechanism and the LF Noise Behavior in Oxidized Si Structures with Ge Nanoclusters

Y. Gomeniuk, V. Lysenko, S. Kondratenko, 2016 .

Flicker noise in deep submicron nMOS transistors

Eddy Simoen, N. Lukyanchikova, N. P Garbar, 2000 .

Hopping Conduction in Structures with Ge Nanoclusters Grown on Oxidized Si (001)

V. Lysenko, Y. Gomeniuk, S. Kondratenko, 2016 .

On the 1/f noise of triple-gate field-effect transistors with high-k gate dielectric

E. Simoen, C. Claeys, N. Lukyanchikova, 2009 .

LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric

E. Simoen, C. Claeys, N. Lukyanchikova, 2011 .

Hopping conduction and LF noise in structures with Ge nanoclusters grown on oxidized Si(001)

Y. Gomeniuk, V. Lysenko, S. Kondratenko, 2016, Journal of Materials Science.

The Noise in Submicron SOI MOSFETs With 2.5 nm Nitrided Gate Oxide

Cor Claeys, Eddy Simoen, K. De Meyer, 2002 .

Drain currents and their excess noise in triple gate bulk p-channel FinFETs of different geometry

Cor Claeys, Eddy Simoen, N. Lukyanchikova, 2013, Microelectron. Reliab..

Analytical Model for the Impact of the Twin Gate on the Floating-Body-Related Low-Frequency Noise Overshoot in Silicon-on-Insulator MOSFETs

E. Simoen, C. Claeys, N. Lukyanchikova, 2006, IEEE Transactions on Electron Devices.

Excess Lorentzian noise in partially depleted SOI nMOSFETs induced by an accumulation back-gate bias

E. Simoen, C. Claeys, N. Lukyanchikova, 2004, IEEE Electron Device Letters.