Jin Tang

Investigation of technology scaling effect on SiGe HBT oscillator phase noise using impulse sensitivity function

D. Sheridan, G. Niu, Jin Tang, 2005, Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005..

Modeling and characterization of SiGe HBT low-frequency noise figures-of-merit for RFIC applications

Alvin J. Joseph, John D. Cressler, David L. Harame, 2002 .

Integration of selectively implanted collector (SIC) of SiGe:C HBT for optimised performance and manufacturability

G. Niu, B. Brown, D. Hammock, 2003, 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440).

Photo effect based avalanche multiplication measurement in highly scaled SiGe HBTs

G. Niu, A. Joseph, D. Harame, 2003, 2003 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 2003. Digest of Papers..

Scaling and technological limitations of 1/f noise and oscillator phase noise in SiGe HBTs

Jin Tang, Zhiming Feng, A.J. Joseph, 2005, IEEE transactions on microwave theory and techniques.

SiGe HBT scaling implications on 1/f noise and oscillator phase noise

G. Niu, A. Joseph, D. Harame, 2004, 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers.

Low-frequency noise figures-of-merit in RF SiGe HBT technology

J. Cressler, Shiming Zhang, G. Niu, 2002, 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278).