D. Minkov

发表

Estimating the sizes of surface cracks based on Hall element measurements of the leakage magnetic field and a dipole model of a crack

Tetsuo Shoji, Yoichi Takeda, D. Minkov, 2002 .

Features of Electro-magnetic Methods for Evaluating Sizes of Surface Cracks in Metals

D. Minkov, 2015 .

A new approach for determining the liquidus and solidus isotherms of the systems AIII-BIII-CV

D. Minkov, N. Nedev, 1988 .

Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films

A. Katsaggelos, F. Willomitzer, O. Cossairt, 2022, Coatings.

Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si

F. Willomitzer, E. Márquez, D. Minkov, 2022, Journal of Non-Crystalline Solids.

Optical Characterization of AsxTe100−x Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method

D. Usanov, A. Nezhdanov, D. Minkov, 2020, Materials.

Optical characterization of thermally evaporated thin films of As40S40Se20 chalcogenide glass by reflectance measurements

J. Gonzalez-Leal, T. Wagner, M. Vlcek, 1998 .

Method for calculating the optical constants of a non-transmitting layer upon a transmitting substrate

D. Minkov, P. H. Drashkova, 1990 .

Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum

E. Márquez, D. Minkov, G. Gavrilov, 2017 .

Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra

J. Gonzalez-Leal, E. Márquez, D. Minkov, 2001 .

Development of novel NDE techniques and their significance in the COE program on the physics and chemistry of fracture and failure prevention

Tetsuo Shoji, Yasumoto Sato, Dorian Minkov, 2002 .

Inspection of metal surface containing cracks by small antennas

T. Shoji, D. Minkov, Yasumoto Sato, 2001 .

Method for determining the optical constants of a thin film on a transparent substrate

D. Minkov, 1989 .

NDE of degradation of thermal barrier coating by means of impedance spectroscopy

K. Ogawa, T. Shoji, D. Minkov, 1999 .

Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum

E. Márquez, D. Minkov, G. Angelov, 2021, Materials.

Measurement of angular distribution of soft X-ray radiation from thin targets in the tabletop storage ring MIRRORCLE-20SX.

K. R. Atkinson, D. Minkov, T. Hanashima, 2011, Journal of synchrotron radiation.

Dramatic Downsizing of Soft X‐Ray Synchrotron Light Source from Compact to Tabletop

D. Minkov, N. Toyosugi, H. Yamada, 2008 .

Targets emitting transition radiation for performing X-ray lithography by the tabletop synchrotron MIRRORCLE-20SX

D. Minkov, H. Yamada, H. Nihira, 2008 .

Optimization of transition radiation emitting targets for storage ring synchrotrons used as X-ray lithography sources

T. Kadono, D. Minkov, N. Toyosugi, 2006 .

Theory and characteristics of transition radiation emitted by low-energy storage-ring synchrotrons for use in X-ray lithography.

T. Kadono, D. Minkov, H. Yamada, 2006, Journal of synchrotron radiation.

Kinetics of Long Term Finite Melt Liquid Phase Epitaxyal Growth of GaAs and GaAlAs Layers. I. Gallium Arsenide

D. Minkov, N. Nedev, 1993 .

Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization

E. Blanco, E. Márquez, D. Minkov, 2021, Coatings.

The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates

E. Blanco, E. Márquez, D. Minkov, 2019, Journal of Non-Crystalline Solids.

Computation of the optical constants of thermally-evaporated thin films of GeSe2 chalcogenide glass from their reflection spectra

P. Villares, J. B. Ramírez-Malo, E. Márquez, 1996 .

Computerization of the optical characterization of a thin dielectric film

R. Swanepoel, D. Minkov, 1993 .

Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum

D. Minkov, 1989 .

Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens

E. Márquez, D. Minkov, A. Stoynova, 2017 .

Optical properties of Ge-As-S thin films

D. Minkov, E. Skordeva, D. Arsova, 1987 .

Optical Constants in the Subgap Region and Vibrational Behaviour by Far-Infrared Spectroscopy of Wedge-Shaped Obliquely-Deposited Amorphous GeS2 Films

J. Gonzalez-Leal, A. M. Bernal-Oliva, R. Prieto-Alcón, 1999 .

Preparation of DLC strip targets for the tabletop storage ring synchrotrons MIRRORCLE

D. Minkov, H. Yamada, S. Zeisler, 2009 .

Tabletop Synchrotron Light Source

Daisuke Hasegawa, Hironari Yamada, D. Minkov, 2014 .

Tabletop storage ring MIRRORCLE extreme ultraviolet lithography source

D. Minkov, D. Hasegawa, H. Yamada, 2012 .

Source for extreme ultraviolet lithography by the tabletop storage ring MIRRORCLE

D. Minkov, D. Hasegawa, H. Yamada, 2008 .

Computation of the optical constants of a thin dielectric layer on a transmitting substrate from the reflection spectrum at inclined incidence of light

D. Minkov, 1991 .

Optical characterization of amine-solution-processed amorphous AsS2 chalcogenide thin films by the use of transmission spectroscopy

E. Blanco, E. Márquez, D. Minkov, 2017 .

Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum

E. Márquez, D. Minkov, G. Angelov, 2018 .

Comparative study of the accuracy of characterization of thin films a-Si on glass substrates from their interference normal incidence transmittance spectrum by the Tauc-Lorentz-Urbach, the Cody-Lorentz-Urbach, the optimized envelopes and the optimized graphical methods

E. Blanco, E. Márquez, D. Minkov, 2018, Materials Research Express.