C. Richier

Study Of The ESD Behavior Of Different Clamp Configurations In A 0.35/spl mu/m Cmos Technology

R. Bellens, C. Richier, G. Mabboux, 1997, Proceedings Electrical Overstress/Electrostatic Discharge Symposium.

Chemical and microstructural characterization of thermally grown alumina scales

K. Natesan, B. Veal, C. Richier, 1995 .

Temperature dependence of electrical properties of 6H-SiC buried gate JFET

G. Guillot, C. Raynaud, C. Richier, 1997 .