J. Cazaux

发表

Angle-resolved electron probe microanalysis revisited

J. Cazaux, 2011 .

Secondary electron emission and fundamentals of charging mechanisms in XPS

J. Cazaux, 2010 .

Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectroscopy (CLS) and Auger Electron Spectroscopy (AES)

J. Cazaux, 1988 .

Auger Microscopy and Electron Probe Microanalysis

J. Cazaux, 1992 .

Charging phenomena on insulating materials: Mechanisms and applications

M. Gautier, J. Duraud, C. Gressus, 1990 .

Concentration gradient at an InP/GaAs interface determined by Auger analysis on a chemical bevel

M. Razeghi, P. Etienne, J. Cazaux, 1986 .

Slow-electron-energy-loss spectroscopy in the reflection mode, compared with electron-energy-loss spectroscopy of fast electrons

A. Nassiopoulos, J. Cazaux, 1986 .

Charging in scanning electron microscopy "from inside and outside".

J. Cazaux, 2006, Scanning.

Electrostatics of insulators charged by incident electrons beams

J. Cazaux, 1986 .

A new experimental approach for characterizing the internal trapped charge and electric field build up in ground-coated insulators during their e− irradiation

M. N. Filippov, E. I. Rau, O. Jbara, 2002 .

A new analytical approach for the transport and the emission yield of secondary electrons from insulators

J. Cazaux, 2002 .

Electron- and X-ray-induced electron emissions from insulators

J. Cazaux, 2001 .

About the charge compensation of insulating samples in XPS

J. Cazaux, 2000 .

Correlations between ionization radiation damage and charging effects in transmission electron microscopy

J. Cazaux, 1995 .

X-ray probe microanalyses and scanning x-ray microscopies

J. Cazaux, 1983 .

Minimum detectable dimension, resolving power and quantification of scanning Auger microscopy at high lateral resolution

J. Cazaux, 1989 .

Some Physical Descriptions of the Charging Effects in Insulators Under Irradiation

J. Cazaux, 1993 .

The influence of X-ray-induced Auger electrons in quantitative electron-induced Auger spectroscopy

J. Cazaux, S. Moutou, 1984 .

Continuous X-ray-induced Auger electron spectroscopy

T. Duc, J. Cazaux, 1983 .

Scanning x‐ray radiography: First tests in an electron spectrometer

J. Perrin, J. Cazaux, D. Mouze, 1982 .

Detection sensitivity for surface atoms in X-ray photoelectron spectroscopy and X-ray-induced Auger electron spectroscopy

J. Cazaux, 1982 .

Simultaneous bulk and surface microanalyis by electron spectroscopy

J. Perrin, J. Cazaux, D. Mouze, 1981 .

Electronic Excitations (3 to 35 eV Range) in Some Layered III–VI Compounds: GaS, GaSe, and InSe

J. Perrin, P. Soukiassian, J. Cazaux, 1974 .

The influence of radiation damage (microscopic causes) on the sensitivity of Auger electron spectroscopy and X-ray photoelectron spectroscopy

J. Cazaux, 1985 .

Spatially resolved surface spectroscopy

J. Olivier, J. Cazaux, 2001 .

Some considerations on the secondary electron emission, δ, from e− irradiated insulators

J. Cazaux, 1999 .

Reflection and transmission auger analysis of thin carbon films

J. Cazaux, D. Gramari, 1984 .

Calculated dependence of few-layer graphene on secondary electron emissions from SiC

J. Cazaux, 2011 .

Dispersion des plasmons de surface dans les films de carbone amorphe

J. Cazaux, D. Gramari, 1977 .

Dispersion of the surface “plasma” losses in semiconductors

J. Cazaux, 1972 .

Scanning X-ray radiography with an improved detection scheme

J. Cazaux, D. Mouze, X. Thomas, 1985 .

Electron back-scattering coefficient below 5 keV: Analytical expressions and surface-barrier effects

J. Cazaux, 2012 .

Prospects in high resolution X-ray photoelectron microscopy

J. Cazaux, 1985 .

Continuous X-ray induced Auger microprobe analysis and microscopy: First results

A. Nassiopoulos, J. Cazaux, D. Gramari, 1983 .

Recent developments and new strategies in scanning electron microscopy *

J. Cazaux, J Cazaux, 2005, Journal of microscopy.

Some physical descriptions of the charging effects of insulators under incident particle bombardment

J. Cazaux, P. Lehuédé, 1992 .

Mechanisms of charging in electron spectroscopy

J. Cazaux, Jacques Cazaux, 1999 .

Electron-induced secondary electron emission yield from condensed rare gases: Ne, Ar, Kr, and Xe

N. Hilleret, Y. Bozhko, J. Cazaux, 2005 .

Work function effects on the positive charging of supported insulating samples exposed to X-rays (as in XPS) and other irradiations

J. Cazaux, 2014 .

Charging effects of MgO under electron bombardment and nonohmic behavior of the induced specimen current

O. Jbara, K. Kim, G. Salace, 1991 .

About the Mechanisms of Charging in EPMA, SEM, and ESEM with Their Time Evolution

J. Cazaux, 2004, Microscopy and Microanalysis.

About the role of the various types of secondary electrons (SE1; SE2; SE3) on the performance of LVSEM

J. Cazaux, J Cazaux, 2004, Journal of microscopy.

Backscattered electron imaging at low emerging angles: a physical approach to contrast in LVSEM.

J. Cazaux, N. Kuwano, K. Sato, 2013, Ultramicroscopy.

Dielectric constant and electron energy losses in solids having two separated groups of filled bands (energy range 3–30 eV)

J. Cazaux, 1971 .

Splitting of electron energy losses in strongly anisotropic crystals

J. Cazaux, 1971 .

e-Induced secondary electron emission yield of insulators and charging effects

J. Cazaux, 2006 .

A physical approach to the radiation damage mechanisms induced by X‐rays in X‐ray microscopy and related techniques

J. Cazaux, J. Cazaux, 1997 .

An expression for the Auger backscattering factor and the ϕ(0) function at oblique incidences

J. Cazaux, 1992 .

A new model of dependence of secondary electron emission yield on primary electron energy for application to polymers

J. Cazaux, 2005 .

Electronic excitation observed by fast electron spectroscopy in graphite at grazing incidence

J. Cazaux, D. Gramari, 1976 .

Optical Constants and Electronic Structure of Crystalline and Amorphous As2S3 in the 3 to 35 eV Range

J. Perrin, P. Soukiassian, J. Cazaux, 1974, April 1.

Interface positions measured at the lattice constant scale by Auger analysis on chemical bevels

J. Olivier, J. Cazaux, G. Laurencin, 1984 .

The Role of the Auger Mechanism in the Radiation Damage of Insulators

J. Cazaux, Jacques Cazaux, 1995 .

Calculated influence of work function on SE escape probability and Secondary Electron Emission yield

J. Cazaux, 2010 .

Calculated effects of work function changes on the dispersion of secondary electron emission data: Application for Al and Si and related elements

J. Cazaux, 2011 .

Material contrast in SEM: Fermi energy and work function effects.

J. Cazaux, 2010, Ultramicroscopy.

A new quantification procedure for elemental mapping by X-ray (absorption) microscopy

J. Cazaux, 1993 .

Secondary electron emission and charging mechanisms in Auger Electron Spectroscopy and related e-beam techniques

J. Cazaux, 2010 .

Correlation between the x-ray induced and the electron-induced electron emission yields of insulators

J. Cazaux, 2001 .

A new approach in non-destructive characterization and X-Y profilometry of coatings

O. Jbara, J. Cazaux, X. Thomas, 1990 .

On some contrast reversals in SEM: application to metal/insulator systems.

J. Cazaux, 2008, Ultramicroscopy.

Auger backscattering factor at primary beam energies above 10 keV

O. Jbara, J. Cazaux, C. Merlet, 1992 .

Determination of thickness maps of thin coatings by EDS EPMA

H. Benhayoune, O. Jbara, J. Cazaux, 1995 .

A new experimental procedure for the backscattering correction in Auger analysis

H. Benhayoune, O. Jbara, J. Cazaux, 1993 .

Some unconventional experiments cross correlating the techniques in surface analysis

O. Jbara, K. Kim, J. Cazaux, 1990 .

Electronic core level microanalyses and microcopies in multipurpose apparatus.

O. Jbara, A. Nassiopoulos, J. Cazaux, 1989, Journal of electron microscopy technique.

Some considerations on the electric field induced in insulators by electron bombardment

J. Cazaux, Jacques Cazaux, 1986 .

A random walk model for the crystallite size effect on the secondary electron yield from insulators

J. Cazaux, 2003 .

Slow-electron-energy-loss spectra and non-dipole transitions in nickel

A. Nassiopoulos, J. Cazaux, 1985 .

About the secondary electron emission from solid hydrogens : H2, HD, D2 and T2

J. Cazaux, 2008 .

Scenario for time evolution of insulator charging under various focused electron irradiations

J. Cazaux, 2004 .

Electron Probe Microanalysis of Insulating Oxides: Monte Carlo Simulations

Omar Jbara, O. Jbara, J. Cazaux, 1997 .

The electric image effects at dielectric surfaces

J. Cazaux, 1996 .

Performance of electron spectroscopies from the point of view of EELS and auger microscopies

C. Colliex, J. Cazaux, 1990 .

Some considerations of the lateral resolution in Auger electron spectroscopy

J. Cazaux, 1987 .

About the Secondary Electron Emission Yield, δ, from e−-Irradiated Insulators

J. Cazaux, 2000, Microchimica Acta.

Detection limits in Auger electron spectroscopy

J. Cazaux, 1984 .

Experimental detection limits in scanning auger microscopy at high lateral resolution

J. Lynch, J. Chazelas, R. Szymanski, 1988 .

Auger signal‐to‐background ratio for incident beam voltages ranging from 30 keV up to 100 keV

J. Chazelas, J. Cazaux, A. Friederich, 1988 .

Line resolution in the sub-ten-nanometer range in SAM

J. Chazelas, J. Cazaux, M. Charasse, 1988 .

Electron spectroscopy for bulk and surface microscopy and microanalysis

J. Cazaux, 1980 .

X-ray analysis by electron spectroscopy

J. Cazaux, 1977 .

Sodium diffusion in glasses during electron irradiation

O. Jbara, P. Trebbia, J. Cazaux, 1995 .

Halogen ion electric field assisted diffusion in fluorite and polyvinyl chloride during electron irradiation

O. Jbara, J. Cazaux, G. Rémond, 1996 .

Influence of electron refraction effects at surfaces and interfaces in quantitative surface analysis with XPS and AES

J. Cazaux, 2013 .

Radiation damage and charging effects of insulators in Electron Microscopy

O. Jbara, K. Kim, J. Cazaux, 1990 .

From the physics of secondary electron emission to image contrasts in scanning electron microscopy.

J. Cazaux, 2012, Journal of electron microscopy.

Electron Probe Microanalysis of Insulating Materials: Quantification Problems and Some Possible Solutions

J. Cazaux, J. Cazaux, 1996 .

Slow electron-energy-loss spectroscopy for surface microanalysis

A. Nassiopoulos, J. Cazaux, 1985 .

Deep-level core-electron loss studies on silicon surface

B. R. Chakraborty, S. M. Shivaprasad, J. Cazaux, 1988 .

Mathematical and physical considerations on the spatial resolution in scanning Auger electron microscopy

J. Cazaux, 1983 .

Critical thicknesses of electrostatic powder coatings from inside

J. Cazaux, 2007 .

Characteristic x‐ray imaging by means of filters

J. Cazaux, 1999 .

Interband Transitions in Some Layered Chalcogenide Semiconductors

J. Perrin, P. Soukiassian, J. Cazaux, 1974 .

About the secondary electron yield and the sign of charging of electron irradiated insulators

J. Cazaux, 2001 .