H. Hyatt

Charged device model (CDM) metrology: limitations and problems

J. Barth, H. Hyatt, T. Diep, 1996, 1996 Proceedings Electrical Overstress/Electrostatic Discharge Symposium.

TLP measurements for verification of ESD protection device response

P. Bellew, H. Hyatt, J. Harris, 2001, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).

New varistor material

F. Modine, H. Hyatt, 1988 .

Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD)

M. Chaine, R. Ashton, L.G. Henry, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

The resistive phase of an air discharge and the formation of fast risetime ESD pulses

H. Hyatt, Hugh M. Hyatt, 1993 .