J. Tseng

Oxide-Trapped Charges Induced by Electrostatic Discharge Impulse Stress

J. Hwu, J. Tseng, 2007, IEEE Transactions on Electron Devices.

Effects of electrostatic discharge high-field current impulse on oxide breakdown

Jen-Chou Tseng, Jenn-Gwo Hwu, J. Hwu, 2007 .

An analog front-end circuit with dual-directional SCR ESD protection for UHF-band passive RFID tag

Ming-Hsien Tsai, Ming-Hsiang Song, Chewn-Pu Jou, 2011, 2011 IEEE International Conference on RFID.

ESD and Latchup Optimization of an Embedded-Floating-pMOS SCR-Incorporated BJT

C. Ou, F. Chiu, J. Tseng, 2016, IEEE Transactions on Electron Devices.

60 GHz low noise amplifiers with 1 kV CDM protection in 40 nm LP CMOS

P. Wambacq, Ming-Hsiang Song, Jen-Chou Tseng, 2012, 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems.