Yongshik Kim

Mature processability and manufacturability by characterizing VT and Vmin behaviors induced by NBTI and AHTOL test

Gunrae Kim, Jongwoo Park, S.-S. Ha, 2010, 2010 IEEE International Reliability Physics Symposium.

Space-Charge-Limited Currents in La2O3 Thin Films Deposited by E-Beam Evaporation after Low Temperature Dry-Nitrogen Annealing

Hiroshi Iwai, Kazuo Tsutsui, Shun-ichiro Ohmi, 2005 .

Analysis of variation in leakage currents of Lanthana thin films

Hiroshi Iwai, Kazuo Tsutsui, Shun-ichiro Ohmi, 2005 .

Electrical Characteristics of High-k La2O3 Thin Film Deposited by E-Beam Evaporation Method

H. Iwai, K. Tsutsui, S. Ohmi, 2003 .

Synthesis and transport properties of LaSrCuO thin films deposited by laser ablation

G. Yi, Dong-Kyun Ko, W. Jo, 1992 .

Electrical properties of vacuum annealed La2O3 thin films grown by E-beam evaporation

Hiroshi Iwai, Kazuo Tsutsui, Yongshik Kim, 2005, Microelectron. J..