Soumendu Bhattacharya

发表

System-Level Specification Testing Of Wireless Transceivers

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2008, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Alternate Testing of Analog and RF Systems using Extracted Test Response Features

Soumendu Bhattacharya, S. Bhattacharya, 2005 .

Automatic multitone alternate test-generaton for rf circuits using behavioral models

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Efficient DNA sensing with fabricated silicon nanopores: diagnosis methodology and algorithms

Abhijit Chatterjee, Vishwanath Natarajan, Soumendu Bhattacharya, 2006, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06).

High coverage analog wafer-probe test design and co-optimization with assembled-package test to minimize overall test cost

Abhijit Chatterjee, Soumendu Bhattacharya, 2003, Proceedings. 21st VLSI Test Symposium, 2003..

Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors

Abhijit Chatterjee, Maryam Ashouei, Soumendu Bhattacharya, 2007, 25th IEEE VLSI Test Symposium (VTS'07).

Iterative built-in testing and tuning of mixed-signal/RF systems

Abhijit Chatterjee, Vishwanath Natarajan, Shreyas Sen, 2009, 2009 IEEE International Conference on Computer Design.

Concurrent Device/Specification Cause–Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures

Abhijit Chatterjee, Shreyas Sen, Shyam Kumar Devarakond, 2012, IEEE Design & Test of Computers.

System-level testing of RF transmitter specifications using optimized periodic bitstreams

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

Visualization in linear programming using parallel coordinates

Abhijit Chatterjee, P. P. Das, Soumendu Bhattacharya, 1993, Pattern Recognit..

Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2005, J. Electron. Test..

Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study

Abhijit Chatterjee, Maryam Ashouei, Soumendu Bhattacharya, 2006, Eleventh IEEE European Test Symposium (ETS'06).

Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures

Abhijit Chatterjee, Shreyas Sen, Shyam Kumar Devarakond, 2010, 2010 28th VLSI Test Symposium (VTS).

Alternate electrical tests for extracting mechanical parameters of MEMS accelerometer sensors

Abhijit Chatterjee, Vishwanath Natarajan, Soumendu Bhattacharya, 2006, 24th IEEE VLSI Test Symposium.

Design of soft error resilient linear digital filters using checksum-based probabilistic error correction

Abhijit Chatterjee, Maryam Ashouei, Soumendu Bhattacharya, 2006, 24th IEEE VLSI Test Symposium.

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

Abhijit Chatterjee, Soumendu Bhattacharya, Sasikumar Cherubal, 2007, IEEE Transactions on Circuits and Systems I: Regular Papers.

Optimized wafer-probe and assembled package test design for analog circuits

Abhijit Chatterjee, Soumendu Bhattacharya, A. Chatterjee, 2005, TODE.

A system-level alternate test approach for specification test of RF transceivers in loopback mode

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2005, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design.

Use of embedded sensors for built-in-test RF circuits

Abhijit Chatterjee, Soumendu Bhattacharya, 2004, 2004 International Conferce on Test.

Production test methods for measuring 'out-of-band' interference of ultra wide band (UWB) devices

Abhijit Chatterjee, Soumendu Bhattacharya, 2005, 23rd IEEE VLSI Test Symposium (VTS'05).

An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores

Abhijit Chatterjee, Soumendu Bhattacharya, Sankar Nair, 2006, IEEE Transactions on Circuits and Systems I: Regular Papers.

On-chip self-calibration of RF circuits using specification-driven built-in self test (S-BIST)

Abhijit Chatterjee, William R. Eisenstadt, Donghoon Han, 2005, 11th IEEE International On-Line Testing Symposium.

Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers

Abhijit Chatterjee, Soumendu Bhattacharya, Rajarajan Senguttuvan, 2009, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise

Abhijit Chatterjee, Soumendu Bhattacharya, Rajarajan Senguttuvan, 2008, 26th IEEE VLSI Test Symposium (vts 2008).

Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection

Abhijit Chatterjee, Donghoon Han, Soumendu Bhattacharya, 2007, IET Comput. Digit. Tech..

Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation

Abhijit Chatterjee, Vishwanath Natarajan, Shreyas Sen, 2011, 2011 24th Internatioal Conference on VLSI Design.

Constrained specification-based test stimulus generation for analog circuits using nonlinear performance prediction models

Abhijit Chatterjee, Soumendu Bhattacharya, A. Chatterjee, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002.

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones

Abhijit Chatterjee, Vishwanath Natarajan, Shreyas Sen, 2012, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Efficient test strategy for TDMA power amplifiers using transient current measurements: uses and benefits

Abhijit Chatterjee, Soumendu Bhattacharya, Ganesh Srinivasan, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

A built-in loopback test methodology for RF transceiver circuits using embedded sensor circuits

Abhijit Chatterjee, Soumendu Bhattacharya, A. Chatterjee, 2004, 13th Asian Test Symposium.

A DFT Approach for Testing Embedded Systems Using DC Sensors

Abhijit Chatterjee, Soumendu Bhattacharya, A. Chatterjee, 2006, IEEE Design & Test of Computers.

Test time reduction for ACPR measurement of wireless transceivers using periodic bit-stream sequences

Abhijit Chatterjee, Soumendu Bhattacharya, Ganesh Srinivasan, 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.

Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF

Abhijit Chatterjee, Soumendu Bhattacharya, Rajarajan Senguttuvan, 2005, IEEE International Conference on Test, 2005..

Low cost parametric failure diagnosis of RF transceivers

Abhijit Chatterjee, Donghoon Han, Shalabh Goyal, 2006, Eleventh IEEE European Test Symposium (ETS'06).

Built-In-Test of Analog and RF Circuits using Embedded Sensors

Abhijit Chatterjee, Soumendu Bhattacharya, A. Chatterjee, 2004 .