Laura Peters

发表

Yield management: IMEC takes system-level approach to DFM

Laura Peters, 2004 .

Materials suppliers feel the pinch

Laura Peters, 2004 .

Yield management: Roadmap challenges underscore troubling trend in yields

Laura Peters, 2004 .

45 to 32 nm : Another evolutionary transition

Laura Peters, 2007 .

Sony chooses CuAg as prime candidate for reliable interconnects

Laura Peters, 2004 .

Options Narrow at 45 nm

Laura Peters, 2006 .

Double gates prompt: Transistor revolution

Laura Peters, 2005 .

Exploring advanced interconnect reliability

Laura Peters, 2002 .

Goldilocks and the three training models: A comparison of three models of low vision reading training on reading efficiency

Gregory L. Goodrich, Laura Peters, Jennine Kirby, 2004 .

NBTI: A growing threat to device reliability

Laura Peters, 2004 .

Industry watch: Hurdles and early benchmarking results for 157 nm resists

Laura Peters, 2004 .

How AR coatings stack up

Laura Peters, 2005 .