G. Kousik

Nondestructive technique to measure bulk lifetime and surface recombination velocities at the two surfaces by infrared absorption due to pulsed optical excitation

Z. Ling, P. Ajmera, G. Kousik, 1992 .

Simultaneous extraction of bulk lifetime and surface recombination velocities from free carrier absorption transients

Z. Ling, P. Ajmera, G. Kousik, 1994 .

Nondestructive measurement of bulk lifetime and surface recombination velocities

Z. Ling, P. Ajmera, G. Kousik, 1993, Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat. No.93CH3283-9).

Fundamental 1/ƒ noise in silicon bipolar transistors

A. Ziel, C. V. Vliet, A. Pawlikiewicz, 1988 .

1/F NOISE IN ALPHA-PARTICLE RADIOACTIVE DECAY OF 94 Pu 239 , 95 Am 241 , AND 96 Cm 244

G. Bosman, G. Kousik, C. Vliet, 1986 .

Damage to insulated gate FETs by electron beam metrology and X-ray exposure

P. Bhattacharya, G. Kousik, R. Nandakumar, 1992 .

Flicker-noise fluctuations in α-radioactive decay

P. Händel, G. Bosman, G. Kousik, 1987 .

Quantum 1/f noise associated with ionized impurity scattering and electron-phonon scattering in condensed matter

Peter Händel, Gijs Bosman, P. Händel, 1985 .

Modelling for Industrial Land Acquisition for SEZ

G. Kousik, Gupta Shatadru, Dan Pranab, 2009 .

Quantum 1/f Noise Associated with Intervalley Scattering in Nondegenerate Semiconductors. I. Analytical Calculations

C. V. Vliet, G. Bosman, G. Kousik, 1989 .

QUANTUM 1/F NOISE IN SEMICONDUCTORS INVOLVING IONIZED IMPURITY SCATTERING AND VARIOUS TYPES OF ELECTRON-PHONON SCATTERING

C. V. Vliet, G. Kousik, 1986 .