P Zaumseil

Measurements of the parameters of shell targets for laser thermonuclear fusion using an x-ray schlieren method

S. I. Fedotov, G. V. Sklizkov, K. Goetz, 1979 .

Inline characterization of SiGe structures on 8 inch Si wafers using the Bede QC200 x-ray diffractometer

T. A. Lafford, P Zaumseil, M Taylor, 2001 .

GeSn/Ge multiquantum well photodetectors on Si substrates.

M. Oehme, J. Schulze, P. Zaumseil, 2014, Optics letters.

A complex x-ray characterization of epitaxially grown high-K gate dielectrics

T Schroeder, P Zaumseil, 2005 .