Mooro El

Reliability of Commercially Available SiC Power Mosfets

Aivars J. Lelis, Daniel B. Habersat, R. Green, 2014 .

Basic Mechanisms of Threshold-Voltage Instability and Implications for Reliability Testing of SiC MOSFETs

Aivars J. Lelis, Daniel B. Habersat, A. Lelis, 2015, IEEE Transactions on Electron Devices.

A Study of High Temperature DC and AC Gate Stressing on the Performance and Reliability of Power SiC MOSFETs

Ronald Green, Aivars J. Lelis, Daniel B. Habersat, 2013 .

Effect of Stress and Measurement Conditions in Determining the Reliability of SiC Power MOSFETs

Aivars J. Lelis, Daniel B. Habersat, A. Lelis, 2013 .