Hiroyuki Tanaka

The degradation of TDDB characteristics of Si0/sub 2//Si/sub 3/N/sub 4//Si0/sub 2/ stacked films caused by surface roughness of Si/sub 3/N/sub 4/ films (DRAMs)

N. Hirashita, Hidetsugu Uchida, T. Ajioka, 1993 .

Formation of porous silicon by metal particle enhanced chemical etching in HF solution and its application for efficient solar cells

Shinji Yae, Naoki Fukumuro, Hiroyuki Tanaka, 2003 .

Effect of Substrate Surface State on Homogeneity of Compensation Temperature through Film Thickness in GdCo Films

Hiroyuki Tanaka, Toshiaki Katoh, Seiji Yoshino, 1982 .