P. E. Lindelof

Two-dimensional nanometer-scale calibration based on one-dimensional gratings

K. Dirscherl, L. Nielsen, J. Garnaes, 1998 .

Comparison between the resistively shunted Josephson junction model incorporating a voltage-dependent current-phase relation and experiments on superconducting thin-film microbridges

P. E. Lindelof, H. H. Jensen, 1976 .