Yong-ha Lee

New 3-Dimensional AFM for CD Measurement and Sidewall Characterization

Yueming Hua, Yueming Hua, Jung-min Lee, 2011 .

A study of the effect of excessive free carbon on mean whisker diameters grown by chemical vapor deposition

D. Lim, D. Choi, Yong-ha Lee, 2005 .

Nano-tribological characteristics of PZT thin film investigated by atomic force microscopy

Young Tae Kim, Seungbum Hong, K. Chung, 2007 .

Fundamental Investigation of the Wear Progression of Silicon Atomic Force Microscope Probes

K. Chung, Dae-Eun Kim, Hae‐Jin Kim, 2013, Tribology Letters.

Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip.

Dae-Eun Kim, Koo-Hyun Chung, K. Chung, 2005, Ultramicroscopy.

Tribological characteristics of probe tip and PZT media for AFM-based recording technology

Seungbum Hong, K. Chung, Dae-Eun Kim, 2004, APMRC 2004 Asia-Pacific Magnetic Recording Conference, 2004..