T. Lagutere

Total Ionizing Dose Response of Multiple-Gate Nanowire Field Effect Transistors

M. Martinez, F. Andrieu, M. Vinet, 2017, IEEE Transactions on Nuclear Science.

SET Sensitivity of Trigate Silicon Nanowire Field-Effect Transistors

F. Andrieu, M. Vinet, P. Paillet, 2019, IEEE Transactions on Nuclear Science.

Investigations on the Geometry Effects and Bias Configuration on the TID Response of nMOS SOI Tri-Gate Nanowire Field-Effect Transistors

O. Faynot, M. Martinez, F. Andrieu, 2018, IEEE Transactions on Nuclear Science.

Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMs

M. Gaillardin, P. Paillet, M. Raine, 2018, IEEE Transactions on Nuclear Science.

TID Response of pMOS Nanowire Field-Effect Transistors: Geometry and Bias Dependence

O. Faynot, M. Martinez, F. Andrieu, 2018, IEEE Transactions on Nuclear Science.

Estimating the Single-Event Upset sensitivity of a memory array using simulation

Philippe Paillet, Marc Gaillardin, Olivier Duhamel, 2017, Microelectron. Reliab..

Method to design low noise differential CMOS VCOs without tail current source

Jean-Marie Paillot, Hervé Guegnaud, Thierry Lagutere, 2006 .