M. Gostkowski

FinFET current mirror design and evaluation

G. Knoblinger, A. Marshall, C. Duvvury, 2005, 2005 IEEE Dallas/CAS Workshop on Architecture, Circuits and Implementtation of SOCs.

Fin thickness asymmetry effects in multiple-gate SOI FETs (MuGFETs)

C.R. Cleavelin, P. Patruno, T. Schulz, 2005, 2005 IEEE International SOI Conference Proceedings.

Full/partial depletion effects in FinFETs

Tsu-Jae King, C.R. Cleavelin, P. Patruno, 2004, 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573).

Body effect in tri- and pi-gate SOI MOSFETs

C.R. Cleavelin, T. Schulz, K. Matthews, 2004, IEEE Electron Device Letters.