Noboru Shiono

Single Event Effects in High Density CMOS SRAMs

Toshiyuki Hattori, Masayuki Sekiguchi, Yasuo Hirao, 1986, IEEE Transactions on Nuclear Science.

Defects in a Gate Oxide Grown after the LOCOS Process

Osaake Nakajima, Chisato Hashimoto, Susumu Muramoto, 1979 .

Neutral electron trap generation in SiO2 by hot holes

Masakazu Shimaya, Shigeo Ogawa, Shigeo Ogawa, 1990 .

Stability of Mo Gate MOS Devices Using High Purity Sputtering Target

Hideo Oikawa, Noboru Shiono, Takao Amazawa, 1984 .

Surface State Formation during Long-Term Bias-Temperature Stress Aging of Thin SiO2–Si Interfaces

N. Shiono, Noboru Shiono, Takehisa Yashiro, 1979 .

Impact of Negative-Bias Temperature Instability on the Lifetime of Single-Gate CMOS Structures with Ultrathin (4?6 nm) Gate Oxides

Masakazu Shimaya, Shigeo Ogawa, Noboru Shiono, 1996 .

A new hot-carrier induced degradation mode under low gate and drain bias stresses in N-channel MOSFETs

Masakazu Shimaya, Shigeo Ogawa, Noboru Shiono, 1993 .