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A silicon-based moving-mirror optical switch

M. F. Dautartas, Y. C. Chen, G. E. Blonder, 1992 .

Thermal conductivity and the microstructure of state-of-the-art chemical-vapor-deposited (CVD) diamond

John E. Graebner, Sungho Jin, Y. Wong, 1993 .

RF measurement technique for characterizing thin dielectric films

P. Mankiewich, Paul Anthony Polakos, A. J. Becker, 1998 .

Measurements of the bulk, C-axis electromechanical coupling constant as a function of AlN film quality

R. Reif, J.J. Lutsky, J. Pastalan, 2000, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.