文
论文分享
演练场
杂货铺
论文推荐
字
编辑器下载
登录
注册
Tsunenori Sakamoto
发表
Nondestructive measurement of thickness and carrier concentration of GaAs epitaxial layer using infrared spectroscopic ellipsometry
Kenji Taniguchi, H. Nakano, Tsunenori Sakamoto, 1998 .