N.M. Zimmerman

Excellent charge offset stability in Si-based SET transistors

A. Fujiwara, Y. Takahashi, N.M. Zimmerman, 2002, Conference Digest Conference on Precision Electromagnetic Measurements.

A capacitance standard based on counting electrons

J. Martinis, N. Zimmerman, M. Keller, 1999, Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031).

Direct resistance comparisons from the QHR to100 M/spl Omega/ using a cryogenic current comparator

N. Zimmerman, R. Elmquist, E. Hourdakis, 2004, IEEE Transactions on Instrumentation and Measurement.